Abstract
We have observed resistance fluctuations in the ballistic regime in short one-dimensional (1D) samples, fabricated by a focused ion beam, and studied their dependences on T and on the number of parallel 1D channels in the sample. We attribute the fluctuations to quantum interference of electrons scattered from the ion-beam-induced imperfections in the boundaries defining the 1D channels. We also observe a drastic reduction of the fluctuations in multiple-channel samples, suggestive of correlation between the channels.
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