Residual Stress Analysis of Textured Materials by X-Ray Diffraction Method

Abstract

The residual stress measurement by the conventional X-ray diffraction was formulated on the assumption that a specimen from polycrystalline materials was quasi-isotropic and homogeneous, and the stress was biaxial and almost constant within the X-ray penetration depth. Therefore, it was not available to analyze the stress state of the textured materials by the conventional measurement as a general rule. In resent years, advanced methods have been proposed for the X-ray stress measurement of textured materials. In some methods, it is assumed that the X-ray elastic constant is derived from the crystallite orientation distribution function of textured materials for solving the first anisotropic problem. However, there is a nonlinear problem in the stress analysis from the measured lattice strain. In present study, the X-ray elastic constants were averaged as the expected value around the normal direction of the X-ray diffraction in a similar way. A stress analysis was proposed by differential calculus of the X-ray elastic constant in order to the avoidance of nonlinear problem. The stress analysis was applied to residual stress measurements of a titanium carbide coating film with preferred orientation and a cold-rolled steel with texture. The calculated values of the X-ray elastic constants showed the linearity on some condition for the film. The X-ray stress determination was carried out by the fitting the gradients of the measured lattice strain.