Abstract
Based on the actual packaging structure of insulated gate bipolar transistor (IGBT) module, this article establishes the power loss model, and analyzes the influence of the position of the lift-off bond wire on the module. Through the theoretical analysis, it is found that the position of the lift-off bond wire is an important factor affecting the aging of the modules. And then the electrothermal coupling model of IGBT is established for simulation, and an experimental platform is built for verification. The results show that the distribution of bond wire lift-off position is one of the characteristics of bond wire failure. When the bond wire lift-off failure is concentrated on a single IGBT chip, it will accelerate the aging process of the modules. Therefore, this article considers that the position of the lift-off bond wire is a significant factor in the aging process of the modules, which should be fully considered in the bond wire state evaluation. In addition, the research results of this article can also provide theoretical reference for the optimization of IGBT module packaging structure.
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