Research on the exposure of radio-electronic equipment to ultrashort electromagnetic pulses and microwave radiation

Abstract

The paper considers two methods of exposure of radio-electronic equipment to ultrashort electromagnetic pulses. The methods of exposure to ultrashort electromagnetic pulses differ in the delivery of radiation energy to the IC. According to the first method, the circuit is placed in an electromagnetic field with the set amplitude frequency response. The second method implies that microwave pulses are injected directly onto the circuit pins. Thus, the main research is aimed at an experimental assessment of the stability of radio equipment and its components to ultrashort electromagnetic pulses and microwave radiation. It describes various dependences of the malfunction index for some integrated circuits (ICs) on the duration of ultrashort electromagnetic pulses and microwave radiation energy. ATmega32A and STM32F microcontroller ICs are used in the research. The paper presents findings on the stability of the IC to the exposure to of ultrashort electromagnetic pulses and microwave radiation about the manufacturing technology, i.e. the housing manufacturing techniques. Following the research, the main feature characterizing the effectiveness of exposure of microcontrollers is the amplitude of the impacting pulses.