Abstract
Abstr act. With the continuous development of electronic technology and the unceasing improvement of manufacturing process, large scale integrated circuits (ICs in abbreviation and IC for its single form henceforth) has now become more and more complex. In modern high-tech industrial equipment, however, its core component is one or a few key large scale ICs. So fault detection for these circuits directly determines qualified rate of the product as well as affects the normal operation of the electronic equipment at the later stage. Therefore, the research on effective fault detection methods for large scale ICs has very important practical meaning.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
