Abstract
In order to obtain the temperature field distribution of the all-film pulsed capacitors (AFPCs) under repetitive high-voltage pulse discharge conditions, we analyze the internal structure of the AFPC, and establish the temperature field simulation model. Based on the FEA, we obtain the overall temperature field distribution of the AFPC, and the relationship between discharge voltage, frequency, and temperature rise. This model can be used to evaluate the temperature rise characteristics of an AFPC in repetitive high-voltage pulse discharge and has certain guiding significance for the safe operation.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
