Abstract
The detection of partial discharge and analysis of sulfur hexafluoride (SF6) purity in gas-insulated switchgears (GIS) is important for diagnosis and operating state assessment of the electric device. This paper introduced a method for rapid purity detection of SF6 based on one-way ion mobility spectrometry. The influence of flow rate, temperature and purity of SF6 on the drift time of SF6 were investigated in details. The drift time of SF6 was found to increase with the rising of impurity in SF6. A time of flight mass spectrometer was used for monitoring of decomposition products in SF6 from partial discharge. SO2, SOF2, SO 2F2, SOF 4 and SiF4 were found to the main discharging decomposition products, which lead to the decrease of purity of SF6.
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