Research on particle noise based on second-order effect

Abstract

The development of integrated circuits has gone through several stages, from the invention of transistors to the emergence of very large scale integrated circuits and system level integrated circuits. Now, the size of integrated circuits enters the nanometer level, and short-channel shot noise becomes an important issue. Short-channel shot noise increases due to factors such as device size reduction and scattering during channel formation. It has a serious impact on the performance, power consumption and reliability of integrated circuits. The formation mechanism of short channel shot noise can be explained from two aspects: one is due to the existence of thermal noise inside the channel, and the other is due to the noise caused by the shot. As the device size decreases, the channel thermal noise gradually changes into shot noise and becomes one of the main noise sources. Aiming at the noise generation mechanism, this paper proposes several methods to solve the short-channel shot noise. Through the research of short-channel shot noise and the exploration of solutions, the impact of shot noise on IC performance can be better understood and dealt with, and the development and innovation of IC technology can be promoted.