Abstract
The automatic in-line glass defect inspection technology based on Dual CCFL(Cold Cathode Fluorescent Lamp) was studied. We take the Dual CCFL as illuminant and placed them with a certain interval. The data processor received and processed the light intensity signals, which was transmitted from the glass ribbon and collected by linear CCD array. According to the characteristics of glass defect, high threshold and low threshold, defect signal was processed by ternaruzation data processing method. The data without defect was discarded, and only defect data was stored. Through the judgment of defect data's connectivity and number of defect data, the defect area was computed and type was recognized.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
