Abstract
In order to provide good experimental environment for insulated gate bipolar transistor (IGBT) and solve its junction temperature measurement problem in the power cycle system, the IGBT pre-threshold voltage is used as a temperature sensitive parameter in this paper. The experimental platform is built based on FPGA as a control core unit to realize multi-channel IGBT junction temperature. Considering the influence of IGBT trailing current, according to the different operating currents of the device, the optimal turn-off duration corresponding to each operating current is determined to reduce the influence of turn-off duration on the normal operation of the device. The experimental results show that determining reasonable turn-off duration can effectively measure IGBT junction temperature and improve the efficiency of the system.
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