Research on Hex Programmable Interconnect Points Test in Island-Style FPGA

Abstract

With the decreasing size of manufacturing process, the scale of island-style field programmable gate array (FPGA) becomes larger, which leads to the increasing complexity of FPGA routing resources, especially hex programmable interconnect points (PIPs). Hex PIPs which span six tiles of the island-style FPGA have complex interconnect rules. Accordingly, research on complete hex PIPs test is rarely involved in the study of routing resources test. Therefore, this paper analyzes the hex PIPs architecture of the island-style FPGA, summarizes the interconnect rules of the hex PIPs mathematically in a two-dimensional coordinate system, and presents two proper test algorithms at the same time. The hex PIPs are divided into three directions, that is, horizontal, vertical, and oblique. According to the proposed coordinate equations, a cycle test structure in the horizontal and vertical directions and a test structure with partial-cascade patterns in the oblique direction are designed respectively. It is concluded that the proposed methods can achieve 100% fault coverage for the hex PIPs test in all directions, and the configuration number for hex lines test with the same methods is significantly decreased than previous researches.