Abstract
The study of electromagnetic sensitivity of electronic modules is crucial for the selection of a component-level pulse current injection (PCI) waveform, which will determine whether a component-level PCI test is equivalent to a system-level pulse illumination test of the system to which the electronic module belongs. For electromagnetic sensitivity analysis, the equivalence between the injection waveform and a typical high-altitude electromagnetic pulse (HEMP) conducted disturbance waveform in a component-level PCI test is studied. Based on an RF low noise amplifier (LNA) test board, component-level PCI tests were performed using 20 ns/500 ns double exponential wave and square-wave pulse with multiple pulse-widths. The damage threshold was analyzed and determined by using vector norm and its internal damage was observed and validated by optical microscopic analysis. The conclusions are demonstrated as follows: first, during square-wave PCI tests of RF LNA, the electromagnetic sensitive parameter action is divided into three regions by pulse-width range, called ∞-norm, 2-norm and competitive failure-dominating regions; second, the electromagnetic damage effect of the RF LNA is mainly caused by the burning of its two cascaded transistors, forming a pulse energy transmission channel with short-circuit impedance from the input port to the ground; third, the 100 ns-width square waveform can be determined as the equivalent injection waveform of a HEMP conducted waveform, and the pulse peak value of injected current is determined as the electromagnetic sensitive parameter for square-wave PCI tests of the RF LNA. The conclusions verified the feasibility of establishing the equivalence between different pulse waveforms according to the electromagnetic sensitivity analysis based on the vector norm theory and effect mechanism analysis.
Highlights
Introduction iationsWith the development of electromagnetic pulse generation technology such as highaltitude electromagnetic pulse (HEMP), lightning electromagnetic pulse (LEMP) and highpower microwave (HPM), electronic systems face serious survival threats [1,2]
Probability descriptions designed to detail the vulnerability of electronic systems attacked by certain EMP [3,4] usually employ the system-level vulnerability assessment method based on Bayesian networks (BN), with the risk factors of electromagnetic environment effect (E3) and reliability theory taken into account in the stress-strength model
To utilize a component-level pulse current injection (PCI) test to assist in system-level tests for damage threshold distribution, it is necessary to study the electromagnetic sensitivity characteristics of the vulnerable electronic components
Summary
The energy contained in a HEMP environment is mainly concentrated below 100 MHz. Because the high frequency or very high frequency (HF/VHF) radio is within HEMP frequency range, the effects of function failure or performance degradation occurred often during the pulse illumination test [15,16]. An electromagnetic pulse through the antenna system coupling induced pulse current, which entered the RF front end, transmitted pulse energy along the RF channel step-by-step, and impacted the RF electronic modules. The results demonstrated that the communication-receiving sensitivity of the SUT decreased, and the analysis of the effect mechanism demonstrated that it was all caused by the damage of the RF LNA component on the RF board [17]. The main coupling channel of the SUT is its RF front-end, and its vulnerable component is LNA when the SUT is exposed to HEMP
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