Research on Calibration Method of Horizontal Loop Magnetic Near-Field Probe

Abstract

Internationally, electromagnetic near- field probe is an important tool to solve the EMC problem of integrated circuits. However, the IEC61967 standard only specifies the calibration method of vertical loop magnetic near-field probe (measuring horizontal magnetic field). This paper proposes a calibration method of horizontal-loop magnetic near-field probe based on micro-strip line TEM field based on the in-depth study of IEC61967 related to probe calibration method. In order to verify this method, a horizontal loop magnetic nearfield probe is fabricated based on LTCC, and a micro-strip line with impedance of 50 <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\Omega$</tex> is designed by using PCB process, and the verification test of the proposed calibration method is carried out. The simulation and experimental results show that the calibration method proposed in this paper can realize the calibration of the horizontal loop magnetic near-field probe, which can make up for the deficiency of the calibration method of the horizontal loop magnetic near-field probe in IEC61967 standard, and has important applicable value.