Abstract
Power IGBT module is widely used in high power conversion applications in various fields because of the advantages of high voltage and high current applications. In order to avoid the influence of temperature rise to the device measurement, pulse test method is widely used to test its static and dynamic parameters, So there are single high pulse voltage source and single pulse high current source in power IGBT modules test instruments. For now in the metrology field, how to calibrate its Single High Pulse Voltage source is a difficult problem. Now the amplitude of single high pulse voltage source is above 7kV with the pulse width as 50 microseconds. Based on detailed research on the test principles of the power IGBT modules test instruments, the pulse high voltage divider and the data acquisition unit are used to setup a calibration device for Single High Pulse Voltage source to calibrate the amplitude of Single High Pulse Voltage source. Resistors are usedto develop the pulse high voltage divider, and did carefully research on the pulse response time, voltage dispersion, voltage regulation of the pulse high voltage divider. Also the data acquisition unit with 20MHz bandwidth and 100MS/s acquisition rate is evaluated through tests including vertical accuracy test, bandwidth test, rise time test, comparison test and etc.. Through above relevant test results, with the comprehensive consideration of the influence of each measurement uncertainty component, It have finished that the evaluation of the uncertainties of the amplitude measurement for Single High Pulse Voltage source. The uncertainty of measurement is better than 2% with the coverage factor as 2.
Highlights
Power IGBT modules, which are the typical representative of semiconductor devices with the characteristics of high voltage, high current, high speed, low voltage drop, high reliability and so on, are widely used in various of important occasions, such as the UPS power supply, the switching power supply, the chopper power supply, the AC motor control and inverter circuit and etc
In China, some kinds of semiconductor devices test equipments are used in the company ofpower IGBT modules production and application, The typical equipment are the series named TRDS produced by LEMSYS SA in Switzerland, and the typical model is TRDS4070 with flexible configuration fordifferent application
Calibration methodof 7kV single voltage pulse for IGBT models test system have been proposed by using the proper digitizer and the pulse high voltage divider box
Summary
Power IGBT modules, which are the typical representative of semiconductor devices with the characteristics of high voltage, high current, high speed, low voltage drop, high reliability and so on, are widely used in various of important occasions, such as the UPS power supply, the switching power supply, the chopper power supply, the AC motor control and inverter circuit and etc. The IGBT modules can be used in the applications of 7kV high voltage and 3kA high current, the companies that produced these modulesinclude SIEMENS, Fairchild, Toshiba, IR, ABB, Fuji and so on. In China, some kinds of semiconductor devices test equipments are used in the company ofpower IGBT modules production and application, The typical equipment are the series named TRDS produced by LEMSYS SA in Switzerland, and the typical model is TRDS4070 with flexible configuration fordifferent application. In China, there are a few companies that producethese devices test equipments, and the typical model is CESI1250A-3000 power semiconductor devices DC test system produced by China Electronics Standardization Institutewhich is called CESI located in Beijing China. The appearance of the equipments is shown in Figure 2. [1]
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
