Research on automatic spectral calibration algorithm for echelle spectrometer

Abstract

Echelle spectrometers are highly sensitive to errors due to their high spectral resolution. Spectral drift can easily occur due to changes in the environment and minor disturbances in the instrument. Therefore, it is crucial to perform spectral calibration before operating the instrument. Since traditional calibration techniques demanded a substantial investment of both time and human resources, a rapid automatic spectral calibration method has been improved in this paper. An automated process of spectral calibration is proposed which overcomes the challenges of conventional high-dimensional parameter inversion. The calibration process is significantly accelerated by employing a segmented and polynomial fitting method for model calibration. The results of precise tests conducted using characteristic wavelengths from various element lamps demonstrate that this method achieves a mean spectral accuracy deviation of 0.0096 nm, with a maximum error of 0.024 nm in the long-wave region. These accuracy levels meet the requirements of the echelle spectrometer. Therefore, the proposed strategy offers a more reliable and efficient tool for spectral analysis technology, while notably reducing the time and labor involved in spectral calibration.