Abstract
As one of the most useful methods in electromagnetic interference (EMI) diagnosis, near-field (NF) scanning is widely used in electromagnetic compatibility (EMC) evaluation of complex devices under test (DUTs). In this paper, a two-stage plane adaptive sampling algorithm is proposed to reduce the acquisition time in the process of NF scanning and to make reconstruction of the radiation source more efficient. The sampling method is based on the region self-growth algorithm and the Voronoi subdivision principle, significantly reducing the number of NF samples in the stage of solving the radiation source model through uniform and non-uniform two-stage sampling. Two experiments were conducted to verify the correctness and effectiveness by comparing with the traditional uniform sampling method.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: The Applied Computational Electromagnetics Society Journal (ACES)
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
