Abstract
In this work, the half lives of 52V, 66Cu and 28Al were measured using a non-paralyzable dead-time correction to the regular exponential decay. For 28Al, a physical dead-time correction was also employed to allow a verification of the mathematical correction used. The resulting values were 3.734(3)min for 52V and 5.061(6)min for 66Cu; as for 28Al, the results were 2.233(9) min using the non-paralyzable correction and 2.228(5)min using the secondary correction, thus validating the mathematical approach.
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