Abstract

This paper demonstrates how the statistical distribution of pinning fields in a ferromagnetic material can be identified systematically from standard magnetic measurements, Epstein frame or Single Sheet Tester (SST). The correlation between the pinning field distribution and microstructural parameters of the material is then analyzed.

Highlights

  • Ferromagnetic materials are ubiquitous in industrial and household applications

  • The magnetic hysteresis is associated with Joule losses occurring when the applied magnetic field varies in quasi-static conditions, i.e. at vanishing frequency

  • We show in this paper that the macroscopic coercivity of ferromagnetic materials can be characterized by a pinning field distribution function ω(κ), which can be systematically identified from standard magnetic measurements

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Summary

INTRODUCTION

Ferromagnetic materials are ubiquitous in industrial and household applications. They are characterized by a nonlinear and dissipative behavior determined by a rich and complex microstructure involving grains, Weiss magnetic domains, Bloch walls and magnetic inhomogeneities or defects, see e.g. Refs. 1 and 2. We show in this paper that the macroscopic coercivity of ferromagnetic materials can be characterized by a pinning field distribution function ω(κ), which can be systematically identified from standard magnetic measurements. The identification of the pinning field probability density ω(κ) is a major step for the representation of ferromagnetic materials in a finite element model for instance, as it contains the information needed to determine straightforwardly the free parameters of the energy-based hysteresis model. The notion of subgradient implies that there exists no 1-1 relationship between h(t) and hirr(t), and between h(t) and hr(t) This non-univocity is the fundamental justification why the response of a hysteretic material depends on the applied field h(t), and on the history.

TWO-SCALE MODEL
CORRELATION WITH MICROSTRUCTURAL STRUCTURE
Findings
CONCLUSION
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