Abstract
Current methods of data representation for electron backscatter diffraction (EBSD) measurements are reviewed. Obtaining diffraction data from microstructures using EBSD has become a relatively straightforward procedure, and EBSD software packages are used to represent these data as qualitative statistics in the form of ideal orientations, pole figures, inverse pole figures, Euler space, and Rodrigues–Frank space. Quantitative statistics in the form of secondary computations allow full microtextural analysis. Additionally, the power of EBSD is demonstrated through positional information representation. Through experimental examples, the conversion of EBSD data to statistical information to facilitate interpretation of results is demonstrated.MST/3678
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