Abstract
Very fast transient over-voltage (VFTO), induced by disconnector operations in gas-insulated switchgears, has become the limiting dielectric stress at ultra-high voltage levels. Much work has been done to investigate single-strike waveforms of VFTO. However, little study has been carried out investigating the repeated strike process, which would influence VFTO significantly. In this paper, we carried out 450 effective experiments in an ultra-high voltage test circuit, and conducted calculations through the Monte Carlo simulation method, to investigate the repeated strike process. Firstly, the mechanism of the repeated strike process is proposed, based on the experimental results. Afterwards, statistical breakdown characteristics of disconnectors are obtained and analyzed. Finally, simulations of the repeated strike process are conducted, which indicate that the dielectric strength recovery speed and polarity effect factor have a joint effect on VFTO. This study enhances the understanding of the nature of VFTO, and may help to optimize the disconnector designed to minimize VFTO.
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