Repeatability and sensitivity characterization of the far-field high-energy diffraction microscopy instrument at the Advanced Photon Source.

Jun-Sang Park,Hemant Sharma,Peter Kenesei

doi:10.1107/s1600577521008286

Abstract

In the last two decades, far-field high-energy diffraction microscopy (FF-HEDM) and similar non-destructive techniques have been actively developed at synchrotron light sources around the world. As these techniques (and associated analysis tools) are becoming more available for the general users of these light sources, it is important and timely to characterize their performance and capabilities. In this work, the FF-HEDM instrument implemented at the 1-ID-E endstation of the Advanced Photon Source (APS) is summarized. The set of measurements conducted to characterize the instrument's repeatability and sensitivity to changes in grain orientation and position are also described. When an appropriate grain matching method is used, the FF-HEDM instrument's repeatability is approximately 5 µm in translation, 0.02° in rotation, and 2 × 10-4 in strain; the instrument sensitivity is approximately 5 µm in translation and 0.05° in rotation.

Highlights

The ability to non-destructively map the internal structure of polycrystalline materials has made significant progress in the past two decades
Based largely on these developments, a new high-throughput high-energy diffraction microscopy (HEDM) instrument is being commissioned at the 6-ID-D endstation of the Advanced Photon Source (APS) (Sagoff, 2020), and the High Energy X-ray Microscope beamline with performance exceeding that of the 1-ID beamline is planned as a part of the APS upgrade (Fenner, 2021)
For DS-A-stainless steel (SS), ten FF-HEDM scans were performed while the sample was rotated in the positive direction and another ten scans in the negative rotation direction (Table 2) spanning over several hours

Summary

Introduction

The ability to non-destructively map the internal structure of polycrystalline materials has made significant progress in the past two decades. Experimental techniques that utilize high-energy X-rays to obtain crystallographic orientation and strain tensor maps of a polycrystalline material in its bulk form have made great strides This class of experimental techniques combined with appropriate analysis strategies is capable of delivering these maps with varying degrees of resolution, precision, and accuracy. At the 1-ID beamline of the Advanced Photon Source (APS), Argonne National Laboratory, several variants of HEDM are used to investigate a wide variety of material systems, often in situ (Lienert et al, 2011; Park et al, 2015; Bernier et al, 2020) Based largely on these developments, a new high-throughput HEDM instrument is being commissioned at the 6-ID-D endstation of the APS (Sagoff, 2020), and the High Energy X-ray Microscope beamline with performance exceeding that of the 1-ID beamline is planned as a part of the APS upgrade (Fenner, 2021). The performance is characterized using two metrics – repeatability and sensitivity – using a well controlled set of experiments and polycrystalline samples fabricated from materials at nominally

Objectives

Results

Discussion

Conclusion