Abstract
AbstractThis paper proposes a method for efficiently removing redundant elements using properties of undetectable faults obtained by test pattern generation. Lines of redundant elements have undetectable single stuck‐at faults. We classify undetectable faults into three categories according to the test pattern generation process, and then assume that some redundant elements can be removed concurrently. Our method produces a nonredundant circuit efficiently by using these properties and generates test patterns with high fault coverage. Some experimental results for ISCAS '85 benchmark circuits are also shown.
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