Abstract
In order to develop an effective dry surface cleaning method, removal of fine particles by pulse air jets was experimentally investigated. A dimensionless resuspension parameter, F*, which is the ratio of drag force on particles to van der Waals adhesion force, was introduced to correlate the removal efficiency. Resuspension experiments were carried out with monodisperse PSL particles and wax particles with diameter between 0.25 and 1.1 μm on silicon wafer and glass plate. As a result, it was found that deposition process of particles on the surface (gravitational settling and impaction at a relatively low impaction velocity) has little effect on the removal efficiency and that consecutive pulse air jet is effective in the removal of fine particles. Further, F* is the key parameter in determining the removal efficiency. The prediction method for the removal efficiency by pulse air jets with F* is proposed.
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