Abstract
A new high-resolution technique for remote surface contouring is proposed. Two photographic recordings of the object scene are made on separate plates. Between the two recordings, either the object or the recording camera is shifted laterally with respect to the optical axis by a known amount. The resultant relative relief displacement due to surface height distribution is accurately measured by a cross-correlation speckle technique. It is shown that a surface height resolution of the order of 50 μm is achieved at a distance of 1 m. The principle involved, experimental details, results, resolution of the method, and criteria for attaining better resolution, are discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
