Remote sensing of terrestrial impact craters: The TanDEM‐X digital elevation model

Abstract

AbstractWith the TanDEM‐X digital elevation model (DEM), the terrestrial solid surface is globally mapped with unprecedented accuracy. TanDEM‐X is a German X‐band radar mission whose two identical satellites have been operated in single‐pass interferometer configuration over several years. The acquired data are processed to yield a global DEM with 12 m independent posting and relative vertical accuracies of better than 2 m and 4 m in moderate and mountainous terrain, respectively. This DEM provides new opportunities for space‐borne remote‐sensing studies of the entire sample of terrestrial impact craters. In addition, it represents an interesting repository to aid in the search for new impact crater candidates. We have used the TanDEM‐X DEM to investigate the current set of confirmed impact structures. For a subsample of the craters, including small, midsized, and large structures, we compared the results with those from other DEMs. This quantitative analysis demonstrates the excellent quality of the TanDEM‐X elevation data. Our findings help to estimate what can be gained by using the TanDEM‐X DEM in impact crater studies. They may also be beneficial in identifying the regions and morphologies where the search for currently unknown impact structures might be most promising.