Abstract
Cu nanoparticles (NPs) embedded in SiO2 glasses were subjected to implantation of 50 keV Zn ions at fluences of 0.5 × 1016 and 1.0 × 1016 ions/cm2. Remarkable enhancement and shift in the surface plasmon resonance (SPR) absorption signal of Cu NPs have been revealed after subsequent annealing for the sample implanted at the fluence of 1.0 × 1016 ions/cm2. According to cross-sectional transmission electron microscope observations and energy dispersive X-ray spectroscopy analyses, increase of partial dielectric constant around the Cu NPs in the matrix is probably responsible for the dramatic changes of the Cu SPR absorption. The results provide an available route to modulate the SPR signal of Cu NPs in SiO2.
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