Abstract

A reliable super-lattice phase change memory (SL-PCM) is investigated. Since the conductivity of SLPCM is changed by Ge flip-flop, <; 300 μA write-current is achieved. Additionally, pulse slope is found to be unnecessary, in fact, too long falling edge has negative effects for SET, since SL-PCM does not melt. As a result, due to small write-current, SL-PCM solves the reliability problems about thermal disturb and electro-migration and provides a potential for next-generation non-volatile memories.

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