Abstract

Abstract : This report summarizes and analyzes the issues relating to Plastic Encapsulated Microcircuit (PEM) Reliability. Included is: (1) discussion of current research efforts within the government and industry, (2) failure modes and mechanisms associated with PEMs, (3) test data on PEMs subjected to HAST, life test, Autoclave, high temperature storage, 85 deg C/85%RH tests, (4) field reliability data, (5) analysis of both test data and field data, (6) a reliability assessment model derived from the data and (7) conclusions regarding the selection and applications of PEMs.

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