Abstract
One-sided magnetooptical (MO) disks of compact-disc size have been evaluated with respect to their reliability by block error rate (BLER) measurement. We have carried out high-temperature and high-humidity tests on our disks. No marked changes in mechanical properties or carrier-to-noise ratio (CNR) after accelerated tests were observed. However, C1 and C2 error count increases were observed. The C2 error count increase indicated increase on large media defect numbers. An Arrhenius plot on the maximum BLER values at elevated temperatures revealed an activation energy of approximately 0.9 eV. Estimated lifetimes of our disks at 31°C are more than 10 years, which means one-sided MO disks have lifetimes as long as two-sided disks, such as the 130-mm MO disk.
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