Reliability sampling plans for Weibull distribution with limited capacity of test facility

Abstract

This paper establishes reliability sampling plans for the Weibull lifetime distribution based on type II censored data with limited capacity of test facility. The products are sold under a general rebate warranty policy. It is also assumed that the shape parameter of the lifetime distribution is known, and the scale parameter is a random variable varying from lot to lot. A cost model is established which contains the cost per unit on test, the cost per unit time for life test, and the costs of rejecting and accepting a unit. An algorithm for determining the optimal reliability sampling plans which minimize the expected average cost per lot is provided. Some numerical results to illustrate the use of the proposed method are studied.