Abstract
Third harmonic (TH) testing is a probably underrated in-line screen tool to detect and eliminate potential infant mortality failures in passive components that is not in focus of current interest. The test is fairly rapid, convenient, and the associated equipment is relatively inexpensive. TH screening is thus advertised as a general means of ensuring robust behaviour of parts that pass this test. The author presents results of an evaluation of the present usage of this screen with a variety of thin-film resistors. A number of questions are considered: • How do resistor manufacturers use this screen and how do they establish accept/reject criteria and what are the conclusions of 20 years of experience with that method? • Are there known physical and chemical defects that this screen misses? • Can rejected parts be correlated with behaviour in short-term and long-term reliability tests? • Can new, small, surface mount technology resistors be reliably screened with TH testing and where are the limitations?
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