Abstract
We report the reliability of aluminum-doped zinc oxide (AZO) thin films exposed to harsh environmental conditions of damp heat. Identical sets of the AZO films grown on float glass substrates were subjected to four different controlled environments of temperature and relative humidity. The selected high and low levels of the temperature were 100°C and 20°C respectively and the selected high and low relative humidity levels were 100% and 20% respectively. The total exposure time for this controlled environment was 120h. Electrical resistance was measured every 24h for each sample. Material composition, crystallinity, optical transmittance and surface morphology of the films were investigated after 120h exposure time. A mixed, full-factorial design of experiment was used in this study, with the response being the electrical resistance. The factors were exposure time, temperature and humidity. The ANOVA results showed that all the considered factors were significant. Although the electrical resistance of the film exposed to high temperature and high relative humidity increased by 20%, the microstructure in the bulk of the film, crystallinity and optical properties of the films exposed to all combinations of temperature and humidity were unchanged.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
