Abstract
We discuss a number of measures taken by Agilent Technologies to ensure the reliability of our fiber optic transceivers. Our procedures for reliability qualification testing, identifying theoretical failure mechanisms, and controlling production are briefly discussed. The second half of the paper describes in some detail the corrosion failure mechanism observed in unprotected oxide VCSELs, and its dependence on environmental parameters. This mechanism is a potential source of concern in new non-hermetic fiber optic parallel transceivers when operated under high-humidity conditions. A number of potential avenues for future improvement, and recommended cautions in reliability testing, are detailed.
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