Abstract
This paper considers the reliability modeling and evaluation of the two-phase Gamma degradation process. We assume the degradation paths of the device in the first and second phases follow the Gamma process with different parameters. And we also suppose the change point and the parameters of this two-phase Gamma process model vary from device to device. For each device, the Akaike information criterion (AIC) is used to detect the change point and the maximum likelihood estimation (MLE) method is adopted to estimate all the unknown model parameters. We find that the MLE of the parameters are unique. Additionally, the reliability function of the two-phase Gamma process model is also calculated. Finally, an example of liqu id coupling devices (LCDs) is applied to illustrate our model and method.
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