Abstract
Abstract This paper is devoted to obtain the reliability equivalence factors of n independent and non-identical components series system. The lifetime of each component is assumed to be exponentially distributed random variable. The results introduced by Rade [Rade L. Reliability equivalence. Microelectronics and Reliability 1993a;33:323–325; Rade L, Reliability survival equivalence. Microelectronics and Reliability 1993b;33:881–894.] can be obtained as special cases from this work when n=1,2 and assuming the components are identical.
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