Abstract

A methodology, based on accelerated degradation testing, is developed to predict the lifetime of remote phosphor plates used in solid-state lighting (SSL) applications. Both thermal stress and light intensity are used to accelerate degradation reaction in remote phosphor plates. A reliability model, based on the Eyring relationship, is also developed in which both acceleration factors (light intensity and temperature) are incorporated. Results show that the developed methodology leads to a significant decay of the luminous flux, correlated colour temperature (CCT) and chromatic properties of phosphor plates within a practically reasonable period of time. The combination of developed acceleration testing and a generalized Eyring equation-based reliability model is a very promising methodology which can be applied in the SSL industry.

Highlights

  • The phosphor is located in close proximity to the semiconductor chip, while in the remote phosphor configuration, there is a distance between the phosphor layer and the chip

  • If the phosphor is placed away from the Light emitting diodes (LEDs) chip at a relatively large distance, which is called a remote phosphor configuration, the probability of light emitting from the phosphor and directly hitting the low-reflectivity LED chip becomes significantly lower, leading to a significant improvement in the phosphor efficiency

  • This study aims at studying the effect of blue light intensity together with thermal stress on the lumen depreciation and the reliability of LED-based products and on the acceleration of optical degradation

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Summary

Introduction

Light emitting diodes (LEDs), made by combining phosphor with blue light sources, are the most commercially available solid state light (SSL) sources.[1,2,3,4,5,6,7,8,9,10] In this type of LED, the phosphor is either coated on the chip or mixed with the lens disc.[11,12,13,14,15,16,17,18,19,20,21,22] The spatial distribution of phosphor in white LED lamps strongly influences the colour uniformity and the efficiency of the light source. SSL devices are normally based on a blue chip, combined with yellow phosphor, and are typically in the range of 4500–8000 K correlated colour temperature (CCT). Recent development strategies are based on the production of white LEDs in the lower (Received June 23, 2015; accepted October 1, 2015; published online November 5, 2015)

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