Abstract
With the increasing interaction between physical devices and communication components, the substation based on the IEC 61850 standard is a type of cyber–physical system. This paper proposes a reliability analysis method for substations with a cyber–physical interface matrix (CPIM). This method calculates the influences from both the physical device failures and the communication devices failures. Two indices, Probability of Load Curtailments and Expected Demand Not Supplied, are used in the reliability analysis. Given the simplified model of the practical substation based on the Chinese IEC 61850 standard, the results show that the substation system had a potential risk of cascading failure under the cyber–physical fusion trend, as the failure in cyber layer would increase the power loss of the whole system. The changing magnitude of Expected Demand Not Supplied increased significantly with increasing transmission delay rate of the process bus.
Highlights
Over the years, cyber–physical systems (CPSs) have attracted considerable attention given their wide applications in grids, intelligent robot networks, embedded systems, and other fields
Acquisition (SCADA) system of a nuclear plant recently experienced a severe cyber-attack [4], so the study of cyber security has become a hot topic in smart grids
This paper proposes a new approach for analyzing the reliability of the IEC 61850 substation, focusing on the relationship between the cyber device and physical device
Summary
Cyber–physical systems (CPSs) have attracted considerable attention given their wide applications in grids, intelligent robot networks, embedded systems, and other fields. The interactions between cyber devices and physical devices in substations based on the IEC 61850 standard might create new failure scenarios to substations. The influence of the usual parts, widely considered in communication, was analyzed based on a new method, the CPIM [12]. This matrix uses a mathematical approach to understand the cyber effects caused by physical failures within one cyber–physical system. This paper proposes a new approach for analyzing the reliability of the IEC 61850 substation, focusing on the relationship between the cyber device and physical device.
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