Reliability analysis for the fractional-order circuit system subject to the uncertain random fractional-order model with Caputo type

Abstract

IntroductionAccording to the competing failure theorem, the fractional-order Resistor Capacitance (RC) circuit system suffers not only from internal degradation but also from external shocks. However, due to the general differences of each failure type in the data availability and cognitive uncertainty, a better model is needed to describe the degradation process within the system. Also, a new reliability analysis method is needed for the circuit system under internal degradation and external shocks. ObjectivesTo demonstrate this problem, this paper proposes a novel class of Caputo-type uncertain random fractional-order model that focuses on the reliability analysis of a fractional-order RC circuit system. MethodsFirst, an uncertain Liu process is used to describe the internal degradation of soft faults and a stochastic process is used to describe the external random shocks of hard faults. Secondly, taking into account the correlation and competition among the fault types, an extreme shock model and a cumulative shock model are constructed, and chance theory is introduced to further explore the fault mechanisms, from which the corresponding reliability indices are derived. Finally, the predictor–corrector method is applied and numerical examples are given. ResultsThis paper presents a reliability analysis of a fractional-order RC circuit system with internal failure obeying an uncertain process and external failure obeying a stochastic process, and gives the calculation of the reliability indexes for different cases and the corresponding numerical simulations. ConclusionA new competing failure model for a fractional-order RC circuit system is presented and analyzed for reliability, which is proved to be of practical importance by numerical simulations.