Reliability analysis based on binary decision diagrams

Abstract

A binary decision diagram (BDD) is a representation of Boolean functions that uses the notion of two‐way branching. It has long been used in the synthesis, simulation and testing of Boolean circuits, and has recently been adopted to solve fault tree models for both quantitative and qualitative reliability analyses. In this paper, the concept of binary decision diagram is first introduced. Then, a new method is proposed to analyze the reliability of fault tolerant systems using binary decision diagrams. Traditionally, such analyses are tackled by using fault trees based on cutsets. For complex models, an algorithm based on binary decision diagrams can shorten solution time dramatically. Experimental results are also presented to demonstrate the practicality and benefits of applying the proposed method in reliability analysis.