Abstract
Epitaxial heterostructures of ordered perovskite PbSc0.5Nb0.5O3 thin films were grown by pulsed laser deposition using MgO and LaAlO3 single-crystal substrates, and La0.5Sr0.5CoO3 bottom electrode layers. The small-signal dielectric response of the heterostructures was measured in a broad range of temperatures (290–625 K) and frequencies (102–106 Hz). The contribution of the film–electrode interfaces was evaluated, and the true properties of the films were analyzed. Both relaxor and normal ferroelectric types of behavior were identified in the films. The evolution of behavior and shift of dielectric maxima were found to correlate with the temperature of deposition and the type of the substrate. This was suggested to refer to the microstructural factors such as in-plane strain, grain size, and misfit dislocations.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
