Relative dissociation fractions ofN2Ounder15–30−keVH−,C−, andO−negative-ion impact

Abstract

The relative dissociation fractions of ${\mathrm{N}}_{2}\mathrm{O}$ are studied under 15--30-keV negative ions ${\mathrm{H}}^{\ensuremath{-}},{\mathrm{C}}^{\ensuremath{-}}$, and ${\mathrm{O}}^{\ensuremath{-}}$ impact. The recoil ions and ion pairs originating from the target molecule ${\mathrm{N}}_{2}\mathrm{O}$ are detected and identified in coincidence with scattered ions in single electron loss (SL) and double electron loss (DL) channels using a time-of-flight mass spectrometer. The dissociation fractions for the production of the fragment ions are obtained. We find that the relative dissociation fractions in SL are smaller than those in DL, and the degree of fragmentation will become greater with the impact energy increasing. We also analyze the coincident TOF spectra of two fragment ions which are produced from dissociation of ${\mathrm{N}}_{2}{\mathrm{O}}^{2+}$ and give the possible dissociation pathways of ${\mathrm{N}}_{2}{\mathrm{O}}^{2+}$ with $15--30\text{\ensuremath{-}}\mathrm{keV}\phantom{\rule{0.16em}{0ex}}{\mathrm{H}}^{\ensuremath{-}},{\mathrm{C}}^{\ensuremath{-}}$, and ${\mathrm{O}}^{\ensuremath{-}}$ impact. There are many studies on ${\mathrm{N}}_{2}\mathrm{O}$ with positive-ion, photon, and electron impact, and we compare our results under negative-ion impact with those works.