Abstract

The aim of this study was to determine relationships between microvascular complications of type 2 diabetes mellitus (T2DM) and trace element levels measured by ICP-MS. One hundred eighteen patients with T2DM (age: 30-65 years) and 40 control subjects were included in the study. The T2DM patients were divided into three groups according to their types of microvascular complications. Patients in group 1 (N.=40) had no microvascular complications. Group 2 included 38 patients with only diabetic retinopathy. Group 3 included 40 patients with diabetic retinopathy and nephropathy. Trace elements, including chromium (Cr), copper (Cu), and zinc (Zn), were measured by inductively coupled plasma mass spectrophotometry (ICP-MS). Mg levels analyzed by ICP-MS were lower in patients with T2DM than in healthy subjects. Additionally, Mg level of 2.1 mg/dL or less was found to be predictive for risk of occurrence of T2DM with no microvascular complications. Cr levels were significantly lower in T2DM patients with diabetic retinopathy and diabetic nephropathy than in T2DM patients with no microvascular complications. Additionally, levels of Cr were much lower significantly in group 3 than in group 2. The predictive value of Cr levels (area under the curve [AUC]=0.734, P=0.007) for occurrence of diabetic retinopathy was 15.2 μg/L (sensitivity = 70%; specificity = 60.5%). This study showed an association between especially low Mg and Cr levels measured via ICP-MS and microvascular complications in patients with T2DM.

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