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Abstract
A new technique has been developed to study the relationship between mechanical properties and craze microstructure in thin films (1 to 5μm) of polystyrene. Thin film samples of thicknesses in this range could be strained in a conventional testing machine and subsequently examined in the deformed state in an electron microscope. The strain rate was systematically varied and its effect was investigated on both quenched and annealed samples. Correlations were found between craze morphology and ductility. A new “craze parameter” has been defined as the width of a strip of material which is involved in the development of a craze. From this value, the average strain and the average volume fraction of fibrils within a craze can be calculated.
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