Relationship between Thin Film Thickness and Structural Properties of BaTiO3 Thin Films Grown on p-Si Substrates

Abstract

In this study, <TEX>$BaTiO_3$</TEX> thin films were grown by RF-magnetron sputtering, and the effects of the thin film thickness on the structural characteristics of <TEX>$BaTiO_3$</TEX> thin films were systematically investigated. Instead of the oxide substrates generally used for the growth of <TEX>$BaTiO_3$</TEX> thin films, p-Si substrates which are widely used in the current semiconductor processing, were used in this study in order to pursue high efficiency in device integration processing. For the crystallization of the grown thin films, annealing was carried out in air, and the annealing temperature was varied from <TEX>$700^{\circ}C$</TEX>. The changed thickness was within 200 nm~1200 nm. The XRD results showed that the best crystal quality was obtained for ample thicknesses 700 nm~1200 nm. The SEM analysis revealed that Si/<TEX>$BaTiO_3$</TEX> are good quality interface characteristics within 300 nm when observed thickness. And surface roughness observed of <TEX>$BaTiO_3$</TEX> thin films from AFM measurement are good quality surface characteristics within 300 nm. Depth-profiling analysis through GDS (glow discharge spectrometer) showed that the stoichiometric composition could be maintained. The results obtained in this study clearly revealed <TEX>$BaTiO_3$</TEX> thin films grown on a p-Si substrate such as thin film thickness. The optimum thickness was 300 nm, the thin film was found to have the characteristics of thin film with good electrical properties.