Abstract
Relationship between residual resistivity ratio ρRT/ρ4.2K and maximum transverse magnetoresistance (Δρ/ρ) max at 77 K and fields up to 1 T was investigated in a wide range of ρRT/ρ4.2K values for a large number of highly oriented graphite samples, i. e. kish graphite (KG) and highly oriented pyrolytic graphite (HOPG) samples. Relationship between ρRT/ρ4.2K and anisotropy factors γT and γTL, which represent the degeree of deviation from single crystal ordering of graphite layer planes, was also studied. For KG samples values of γT and γTL are very small (<0.02), and there is no correlation between ρRT/ρ4.2K and γT and γTL for KG samples, while for HOPG samples γT and γTL increase with decreasing ρRT/ρ4.2K. Plots of (Δρ/ρ) max at 77 K and 1 T against ρRT/ρ4.2K show some scatter, but the correlation is clearly good, and (Δρ/ρ) max shows a trend of saturation at large values of ρ4.2K . It can be experimentally shown that this trend is due to the limitation to the mean relaxation time of the carriers by carrier-phonon scatteringin highly oriented graphite even at 77 K.
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