Abstract
A detailed investigation of the correlation between mechanical damage and the change in electrical resistance induced by cyclic tensile loading is performed for polymer-supported gold, copper, and printed silver films. Four distinct types of resistance response to mechanical loading are described and linked to the mechanical properties and microstructure of thin films. It is shown that significant topographical changes induced by cyclic loading can result in minor changes in the overall electrical resistance. Presented results show that an underestimation of mechanical damage can be made when only the electrical failure criterion is used for reliability characterization of polymer-supported metal films.
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