Abstract
High-T c copper-oxide superconductors are characterized from the viewpoint of crystal chemistry through comparative analyses of Cu-O bond lengths, Madelung site potentials and bond valence sums. The interrelationships among these structural and electronic parameters are investigated in detail for the elucidation of the crystal-chemical factors governing T c and the species of doped carriers. Two characteristics, the strain parameter for CuO2 planes calculated on the basis of bond valence sums and the Madelung-potential difference between in-plane O and Cu sites, are shown to represent an essentially equivalent physical content. The ability of the present analysis to predict the maximum value of T c of (possible candidates for) cuprate superconductors is also discussed.
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