Abstract
The oxygen octahedral can be distorted by epitaxial strain due to the lattice mismatch. The epitaxial strain (εyy) linearly decreases from − 0.244% to − 0.445% with the growth temperature. Thin films grow along c axis on the SrTiO3 substrate and exhibit the epitaxial relationship of Ba(Co,Zn)1/3Nb2/3O3 (001) // SrTiO3 (001). The superlattice reflections arising from in-phase tilting of the oxygen octahedra are clearly visible along [010] and [111] zone axis. The IR modes at 330 cm−1 and 390 cm−1 related to in-phase tilting are observed in far-infrared reflectivity spectroscopy. The calculated Q×f values from far-infrared reflectivity spectra of films grown at 550 °C to 700 °C increases from 51,000 GHz to 91,000 GHz mainly due to the enhancement of crystalline quality. The intrinsic quality factor (Q) is mainly contributed by O-(Co, Nb)-O and O-(Zn, Nb)-O bonding modes, while in-phase tilting in BCZN films may result in enhanced dielectric constants.
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