Abstract
It has been reported that the electrical properties of RuO 2 -.based thick-film resistors are dependent on the particle size of the Ru0 2 in the inks used to make the resistors. In order to explain this dependence, a mathematical analysis was made to see if the rule equations used to blend end-member cermet resistor inks to give inks with intermediate resistance values could be applied. This analysis led to the conclusion that these mixing rules cannot be used to explain file changes in resistence and the temperature coefficient of resistance (TCR) that occur as the particle size of the RuO 2 in the inks is varied. It was found, however, that alterations in the elemental resistor structure associated with the variations in the particle size of the oxide could be used to explain the changes observed.
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