Abstract
Backcross‐derived hard red winter (HRW) wheat (Triticum aestivum L.) lines MT06X424‐B6 (Reg. No. GP‐871, PI 660987) and MT06X424‐B20 (Reg. No. GP‐872, PI 660988) (‘Yellowstone’*4/KS96WGRC40) were developed by transferring the resistance gene Lr41 for leaf rust (caused by Puccinia triticina Eriks.) and the resistance gene Cmc4 for wheat curl mite (WCM; Aceria tosichella Keifer) from HRW wheat germplasm KS96WGRC40 into Montana HRW wheat Yellowstone using marker‐assisted selection. Putatively resistant lines were selected with PCR markers in the BC3F2 generation. Resistance to leaf rust and WCM was confirmed by screening under controlled conditions in the BC3F3 and BC3F4 generations, respectively. MT06X424‐B6 and MT06X424‐B20 are resistant to leaf rust (isolate PBJL) and wheat curl mite. MT06X424‐B6 is phenotypically similar to the recurrent parent Yellowstone. MT06X424‐B20 is shorter than Yellowstone and has low kernel polyphenol oxidase.
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